Advanced Characterization Techniques

Advanced Characterization Techniques

Participants will understand the operating principle in advanced measurement and characterization techniques, as well as analyze and interpret the measurement results. The course contents include an introduction to advanced measurement techniques such as scanning electron microscopy, light microscopy, transmission electron microscopy, atomic force microscopy, spectroscopic methods, diffractometry methods, principle of scattering, mechanical measurements and analysis of trace.
Course Objectives

At the end of the course, participants are able to:

1. Determine the working principle of different advanced characterization techniques.
2. Demonstrate how measurement results are obtained using advanced characterization techniques.
3. Report the measurement results using appropriate techniques.

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